The International Conference on Compound Semiconductor Manufacturing Technology "Sharing Ideas Throughout the Industry" 2009 Conference Workshops
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| Moving from Reliability to Manufacturability Bill Roesch, TriQuint Semiconductor |
| Failure Analysis – Fault Localization Kevin Berger, Analytical Solutions, Inc |
| Transmission Electron Microscopy Based
Failure Analysis Mike Salmon, Evans Analytical Group |
| Electrical, Thermal and Environmental
Reliability of Transistors: Experimental Techniques to
Identify Fundamental Degradation Mechanisms Professor Jesus del Alamo, Massachusetts Institute of Technology |
| Fully Coupled Process and Device Simulation
for Understanding Reliability Professor Mark Law, University of Florida |
| Modern Thermography for Semiconductor
Technology for Reliability Testing: Channel Temperature and
Stresses/Strains in Devices Professor Martin Kuball, University of Bristol |
