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Product Sensitivity
Analysis on Multithrow TX/RX Switches |
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| Keywords: pHEMT, Harmonics, Linearity, Sensitivity,
Switch, PSA Abstract A method for data alignment of device characteristics as measured on Process Control Monitors (PCM) with the circuit level performance of adjacent multithrow switch circuits has been developed. This technique provides a powerful method for correlating extrinsic and intrinsic device characteristics with circuit performance. This method provides a valuable tool that is being used to improve device modeling, device development and production yields. |
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