Optimization of PHEMT for Microwave Power Applications

T. Baksht, S. Solodky, A. Khramtsov, * S. Hava * and Yoram Shapira

shapira@eng.tau.ac.il;phone:972-36409452

Faculty of Engineering,Tel Aviv University,Ramat Aviv,69978,Israel;

*Engineering Faculty,Ben-Gurion University of the Negev,Beer Sheva,84105,Israel;

Mark Leibovich and Gregory Bunin

Gal El (MMIC)P.O.B.330,Ashdod 77102,Israel

markl@is.elta.co.il;phone:972-88572434

 

Keywords:PHEMT,breakdown,impact ionization, Design of Experiment

 

Abstract

Optimization of PHEMTs for increasing their breakdown voltage and yield is an important manufacturing problem.A methodology,which enables controlling the safe operation area (SOA)of PHEMTs and tuning their layout parameters for yield improvement is presented.

 

 

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