Transition of SiC MESFET Technology from Discrete Transistors to High Performance MMIC Technology
J.W. Milligan, J. Henning, S.T. Allen, A. Ward, P. Parikh, R.P. Smith, A. Saxler, Y. Wu and J. Palmour
Keywords: SiC, MESFET, MMIC, HPSI, HTOL, GaN
Significant progress has been made in the development of SiC MESFETs and MMIC power amplifiers manufactured on 3-inch high purity semi-insulating (HPSI) 4H-SiC substrates. MESFETs with a MTTF of over 200 hours when operated at a Tj=295oC are presented. High power SiC MMIC amplifiers are shown with excellent yield and repeatability using a released foundry process. GaN HEMT operating life of over 500 hours at a Tj=160o is shown. Finally, GaN HEMTs with 30 W/mm RF output power density are reported.