Analysis on Multithrow TX/RX Switches
|Keywords: pHEMT, Harmonics, Linearity, Sensitivity,
A method for data alignment of device characteristics as measured on Process Control Monitors (PCM) with the circuit level performance of adjacent multithrow switch circuits has been developed. This technique provides a powerful method for correlating extrinsic and intrinsic device characteristics with circuit performance. This method provides a valuable tool that is being used to improve device modeling, device development and production yields.
|12.4 PDF||Return to TOC|