A DOE Approach to Product Qualification For Linear Handset Power Amplifiers

P.J. Zampardi, D. Nelson, P. Zhu, C. Luo, S. Rohlfing, and A. Jayapalan

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Keywords: HBT, Power Amplifier, Design of Experiments, Manufacturability



Variation in starting wafer material impacts yield and performance of linear power amplifiers for handset applications.  This work presents a design of experiment approach for evaluating circuit sensitivities based on epi material variations that can be used for product qualification.  This approach provides a systematic understanding of how the epi material influences the final product performance and allows expected parametric spread to be predicted accurately with a minimal number of wafers.  As a result, product performance distributions can be quickly and accurately determined in the development phase of a product.



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