FFT (Flow Free Thin) Mold Study for 44um Fine Pitch Device Application

J. M. Liu, Y.S. Lu, X.S. Pang Wireless Packaging System Laboratory, Technology Solutions Organization, Freescale Semiconductor (China) Ltd.

R60671@freescale.com Tel: 86-22-85686447 Fax: 86-22-85686555

Keywords: FFT, Granular Compound, Fine Pitch


The paper introduces the advantages of FFT mold technology, and presents an analysis of granular compound properties and parameters effect on wire sweep. Key mold parameters for 44um fine pitch device are determined based on wire sweep performance and wire sweep can be controlled below 1.5%. Strip warpage after PMC (Post Mold Cure) is resolved through FEM analysis and compound formation improvement.


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