High-Volume Low Frequency Noise Characterization Technique

Cristian Cismaru, Mark Banbrook, and Peter J. Zampardi

Skyworks Solutions, Inc., 2427 Hillcrest Drive, Newbury Park, CA 91320

Keywords: 1/f noise, Flicker noise, III-V’s, HBT, FET, high-volume test


This work demonstrates a low frequency noise measurement technique and setup that is suitable for high-volume testing. This measurement setup allows us to collect a high volume of data very rapidly compared to conventional methods, making routine 1/f noise characterization measurements possible. This added capability is very beneficial in studying new device designs or guiding process development.

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