Product Sensitivity Analysis on Multithrow TX/RX Switches

Jerod Mason, David Petzold, Aparna Joshi, Edward Aspell
Skyworks Solutions, Inc.
20 Sylvan Road, Woburn, MA, 01801, USA,
Tel: (781) 376-3000, Email:

Keywords: pHEMT, Harmonics, Linearity, Sensitivity, Switch, PSA

A method for data alignment of device characteristics as measured on Process Control Monitors (PCM) with the circuit level performance of adjacent multithrow switch circuits has been developed. This technique provides a powerful method for correlating extrinsic and intrinsic device characteristics with circuit performance. This method provides a valuable tool that is being used to improve device modeling, device development and production yields.
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