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Che-Kai Lin
WIN Semiconductors Corporation
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5.2.2021 Investigation of Un-doped GaN Cap Layer on RF and Trap Related Characteristics in AlGaN/GaN HEMTs
Wen-Hsin Wu, WIN Semiconductors CorporationYong-Han Lin, WIN Semiconductors CorporationChe-Kai Lin, WIN Semiconductors CorporationFan-Hsiu Huang, WIN Semiconductors CorporationWei-Chou Wang, WIN Semiconductors CorporationDownload Paper