Hsuan Ling Kao

Chang Gung University
  • 5.4.2021 Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer

    Chia-Hao Liu, Chang Gung University,
    Hsien-Chin Chiu, Chang Gung University,
    Hsiang Chun Wang, Chang Gung University,
    Hsuan Ling Kao, Chang Gung University
    Chong Rong Haung, Chang Gung University,
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