X. Yang

MEC, BAE Systems, IQE

  • The First 0.2um 6-Inch GaN-on-SiC MMIC Process

    R. Isaak, MEC, BAE Systems, IQE
    J. Diaz, MEC, BAE Systems, IQE
    M. Gerlach, MEC, BAE Systems, IQE
    J. Hulse, MEC, BAE Systems, IQE
    L. Schlesinger, MEC, BAE Systems, IQE
    P. Seekell, MEC, BAE Systems, IQE
    W. Zhu, MEC, BAE Systems, IQE
    W. Kopp, MEC, BAE Systems, IQE
    X. Yang, MEC, BAE Systems, IQE
    A. Stewart, MEC, BAE Systems, IQE
    K. Chu, MEC, BAE Systems, IQE
    P. C. Chao, MEC, BAE Systems, IQE
    X. Gao, MEC, BAE Systems, IQE
    M. Pan, MEC, BAE Systems, IQE
    D. Gorka, MEC, BAE Systems, IQE
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  • May 12, 2022 // 3:20pm

    18.1 Polyimide Film Process Equipment Qualification

    Jose Diaz, BAE Systems Inc
    X. Yang, MEC, BAE Systems, IQE
    Amehayesus Gebreyohannes, BAE Systems
    Nitin Kalra, BAE Systems

    Abstract

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