10b.5 Transient Thermoreflectance for Device Temperature Assessment in Pulsed-Operated GaN-based HEMTs

Sara Martin Horcajo, Centre for Device Thermography and Reliability (CDTR), University of Bristol
James Pomeroy, University of Bristol
Benoît Lambert, United Monolithic Semiconductors Germany
Helmut Jung, United Monolithic Semiconductors GmbH, Ulm, Germany
Martin Kuball, University of Bristol
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