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11.1 Suppression of Current Collapse in AlGaN/GaN MISHEMTs using in-situ SiN Gate Dielectric and PECVD SiN Passivation
Huaxing Jiang, Hong Kong University of Science and Technology
Chao Liu, Hong Kong University of Science and Technology
Xing Lu, Hong Kong University of Science and Technology
Kei May Lau, Hong Kong University of Science and Technology
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