11.1 Suppression of Current Collapse in AlGaN/GaN MISHEMTs using in-situ SiN Gate Dielectric and PECVD SiN Passivation - CS MANTECH Conference CS MANTECH Conference

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11.1 Suppression of Current Collapse in AlGaN/GaN MISHEMTs using in-situ SiN Gate Dielectric and PECVD SiN Passivation

Huaxing Jiang, Hong Kong University of Science and Technology

Chao Liu, Hong Kong University of Science and Technology

Xing Lu, Hong Kong University of Science and Technology

Kei May Lau, Hong Kong University of Science and Technology

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