11.2 Bias Stress-Induced Interfacial Instability Characterization in Oxidized SiC with Novel Non-contact Approach - CS MANTECH Conference CS MANTECH Conference

11.2 Bias Stress-Induced Interfacial Instability Characterization in Oxidized SiC with Novel Non-contact Approach

Marshall Wilson, Semilab SDI, Tampa, FL,

Alexandre Savtchouk, Semilab SDI

Dmitriy Marinskiy, Semilab SDI, Tampa, FL,

Jacek Lagowski, Semilab SDI, Tampa, FL,

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