11.2 Bias Stress-Induced Interfacial Instability Characterization in Oxidized SiC with Novel Non-contact Approach

Marshall Wilson, Semilab SDI, Tampa, FL,
A. Savtchouk, Semilab SDI
Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
J. Lagowski, Semilab SDI
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