Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
11.2 Bias Stress-Induced Interfacial Instability Characterization in Oxidized SiC with Novel Non-contact Approach
Marshall Wilson, Semilab SDI, Tampa, FL,
Alexandre Savtchouk, Semilab SDI
Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
Jacek Lagowski, Semilab SDI, Tampa, FL,
Download Paper