Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
2025 Second Call for Papers
Authors link
Abstract Submission Site is LIVE!
The first 10 abstracts submitted and accepted will be eligible for a prize drawing.
Submission Link
Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
2025 Second Call for Papers
Authors link
May 01, 2019 // 4:30pm – 4:50pm
11.2 Channel temperature determination for GaN HEMT lifetime testing – Impact of test fixture and device layout.
Filip Gucmann, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
James Pomeroy, University of Bristol
Andrei Sarua, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
Download Paper
