12.2.2023 High Temperature Studies of 140 nm T-gate AlGaN/GaN HEMT Devices

Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
Adam Miesle, KBR Inc.
Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
Hanwool Lee, KBR Inc.
Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,
N. Miller, Air Force Research Laboratory
Matt Grupen, Air Force Research Laboratory, Sensors Directorate
Kyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USA
Antonio Crespo, Air Force Research Laboratory, Sensors Directorate
Gary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH
Wenjuan Zhu, University of Illinois, Urbana
Kelson Chabak, Air Force Research Laboratory, Sensors Directorate
Andrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,

12.2.2023_CSMANTECH_FinalPaper_HT_Islam_rev