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19.3 40 Gb/s VCSELs Test Data Collection, Analysis, and Process Problem Identification
Junyi Qiu, University of Illinois at Urbana-Champaign
Hsiao-Lun Wang, University of Illinois at Urbana-Champaign
Curtis Wang, University of Illinois at Urbana-Champaign
Xin Yu, University of Illinois at Urbana-Champaign
Milton Feng, University of Illinois Urbana-Champaign
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