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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitor
Authors
Digests
Contact
2.4.2021 The Phenomenon of Charge Activated Visibility of Electrical Defects In 4H-SiC; Application for Comprehensive Non-Contact Electrical and UV-PL Imaging and Recognition of Critical Defects
M. Wilson, Semilab SDI
David Greenock, X-Fab
Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
Carlos Almeida, Semilab SDI
John D’Amico, Semilab SDI
Jacek Lagowski, Semilab SDI, Tampa, FL,
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