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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitors
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Contact
Attendee/Exhibitor Registration
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20.11 Comparison of Ion-Milling and Ion-Sputtering to Remove Edge Roughness of EBL Defined Emitter Metallization in InP/GaAsSb DHBTs
Wei Quan, ETH-Zurich
Ralf Flueckiger, ETH-Zurich
Maria Alexandrova, ETH-Zurich
Colombo Bolognesi, ETH-Zurich
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