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2024 Advance Program
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April 30, 2019 // 4:00pm – 4:20pm
5.2 A Systematic Data Mining Approach to separate Epitaxial Impacts from Process Impacts for GaAs pHEMT Technologies
Franck Bourgeois, United Monolithic Semiconductors GmbH
Peter Gretz, United Monolithic Semiconductors GmbH
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