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April 30, 2019 // 4:20pm – 4:40pm
5.3 Modelling of Backside-induced ESD Defects in GaAs Front End Manufacturing
Markus Lanz, United Monolithic Semiconductors GmbH
Dag Behammer, United Monolithic Semiconductors GmbH
Holger Weiner, United Monolithic Semiconductors GmbH
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