5.4.2021 Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer

Hsiang Chun Wang, Chang Gung University,

[embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/5.4-.2021-Improved-Gate-Reliability-Normally-Off-p-GaNAlNAlGaNGaN-HEMT-with-AlGaN-Cap-Layer.pdf” download=”all” viewer=”google”]

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