5.4.2021 Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT with AlGaN Cap-Layer

Chia-Hao Liu, Chang Gung University,

Hsien-Chin Chiu, Chang Gung University,

Hsiang Chun Wang, Chang Gung University,

Hsuan Ling Kao, Chang Gung University

Chong Rong Haung, Chang Gung University,

[embeddoc url=”http://csmantech.org/wp-content/uploads/Digest/Digests-2021/5.4-.2021-Improved-Gate-Reliability-Normally-Off-p-GaNAlNAlGaNGaN-HEMT-with-AlGaN-Cap-Layer.pdf” download=”all” viewer=”google”]

Download Paper