5.6 Non-contact Characterization of Bias Stress-Induced Instability of 2DEG in SiN/AlGaN/GaN Structures

Marshall Wilson, Semilab SDI, Tampa, FL,
A. Savtchouk, Semilab SDI
Carlos Almeida, Semilab SDI
Andrew Findlay, Semilab SDI
J. Lagowski, Semilab SDI
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