5.6 Non-contact Characterization of Bias Stress-Induced Instability of 2DEG in SiN/AlGaN/GaN Structures

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Marshall Wilson, Semilab SDI, Tampa, FL,

A. Savtchouk, Semilab SDI

Carlos Almeida, Semilab SDI

Andrew Findlay, Semilab SDI

J. Lagowski, Semilab SDI

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