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5.6 Non-contact Characterization of Bias Stress-Induced Instability of 2DEG in SiN/AlGaN/GaN Structures
Marshall Wilson, Semilab SDI
Alexandre Savtchouk, Semilab SDI
Carlos Almeida, Semilab SDI
Andrew Findlay, Semilab SDI
Jacek Lagowski, Semilab SDI
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