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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
Conference
Conference at a Glance
Advance Program & Sessions
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Exhibitor
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5a.4 Back Bias Ramping and Photoionization Spectroscopy Analysis of GaN-on-Si HFETs
Alexander Pooth, University of Bristol
Michael Uren, University of Bristol
Trevor Martin, IQE Europe, St Mellons, Cardiff, UK
Martin Kuball, University of Bristol
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