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About Us
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
Schedule
Digests
Sponsors
Contact
Attendee Registration
8.1 Real-Time Control of Layer Thickness and Thickness Uniformity for Single Wafer Reactor MOCVD Systems
Sandeep Krishnan, Veeco Instruments Inc.
Michael Chansky, Veeco Instruments Inc.
Daewon Kwon, Veeco Instruments Inc.
Earl Marcelo, Veeco MOCVD Operations
Mandar Deshpande, Veeco Instruments Inc.
Ronald Arif, Veeco Instruments Inc.
Ajit Paranjpe, Veeco Instruments
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