9.1 Preliminary DC Evaluation of HRL’s T3 GaN Technology Reliability Characteristics

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Shawn Burnham, HRL Laboratories, LLC.

Ross Bowen, HRL Laboratories, LLC.

Joe Tai, HRL Laboratories, LLC.

David Brown, HRL Laboratories, LLC.

Robert Grabar, HRL Laboratories, LLC.

Dayward Santos, HRL Laboratories, LLC.

Jesus Magadia, HRL Laboratories, LLC.

Isaac Khalaf, HRL Laboratories, LLC.

Miroslav Micovic, HRL Laboratories, LLC.

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