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Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
Conference
Conference at a Glance
Advance Program & Sessions
Sponsors
Exhibitor
Exhibitor Floorplan
Exhibitor add-ons
Authors
Digests
Contact
Failure Modes and Effects Criticality Analysis (FMECA) of AlGaN/GaN Based Microwave Devices Degradation Mechanisms
Shahrzad Salemi, University of Maryland
A. Christou
