Measuring the Thermal Conductivity of the GaN Buffer Layer in AlGaN/GaN HEMTs: Effect of Carbon and Iron Doping

M. Power, University of Bristol
J.W. Pomeroy, University of Bristol
Y. Otoki, Hitachi Metals
T. Tanaka, Hitachi Metals
J. Wada, Hitachi Metals
M. Kuzuhara, University of Fukui.
W. Jantz, SemiMap Scientific Instruments
A. Souzis, II-VI Wide Bandgap Group
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