RDSON Stability of GaN High Voltage Power Devices Post Long-Term Stress: A New Method to Screen Unstable RDSON Performers

Hyeongnam Kim, International Rectifier Corp.
H. Kannan, International Rectifier Corp.
Y. Pan, International Rectifier Corp.
D. Veereddy, International Rectifier Corp.
R. Garg, International Rectifier Corp.
C. Zhu, International Rectifier Corp.
J. Sun, International Rectifier Corp.
Bhargav Pandya, International Rectifier Corp.
D. Smith, International Rectifier Corp.
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