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Explore
Our Mission
Board of Directors
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Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitors
Authors
Digests
Contact
All 2025 Final Papers zipped
Conference App
Sputtered Iridium Gate Module for GaN HEMT with Stress Engineering and High Reliability
Richard Lossy, Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik (FBH),
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