Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitors
Authors
Digests
Contact
Attendee/Exhibitor Registration
Hotel Registration
Explore
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
2022 Conference Collage
Sponsors
Exhibitors
Authors
Digests
Contact
Attendee/Exhibitor Registration
Hotel Registration
Stress and Characterization Strategies to Assess Oxide Breakdown in High-Voltage GaN Field-Effect Transistors
S. Warnock, Massachusetts Institute of Technology
J. A. del Alamo, Massachusetts Institute of Technology
Download Paper