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The Use of a Structured Approach to Solve Yield Limiting Defects in a Compound Semiconductor Factory
Jan Campbell
Qizhi He
Howie Yang, TriQuint Semiconductor,TX
Martin Ivie
John Gibbon, Qorvo
Darrel Lupo, TriQuint Semiconductor,TX
Dario Nappa, TriQuint Semiconductor,TX
Jerry Beene, TriQuint Semiconductor,TX
