17.2 Top Surface Edge Contact for Wafer Level Electrical Characterization of 2DEG in AlGaN/GaN on Semi-insulating Wafers

May 19, 2022 // 1:50pm

Dmitriy Marinskiy, Semilab SDI, Tampa, FL,

B. Schrayer, Semilab SDI

Mark Benjamin, Lehighton Electronics Inc,

J. Lagowski, Semilab SDI

Marshall Wilson, Semilab SDI, Tampa, FL,

D. Nguyen, Semilab LEI, Lehighton, PA

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