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About Us
Our Mission
Board of Directors
Executive Committee
Technical Program Committee
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Digests
Sponsors
Contact
Attendee Registration
Yield improvement of metal-insulator-metal capacitors in MMIC fabrication process based on AlGaN/GaN HFETs
S. A. Chevtchenko, Ferdinand-Braun-Institut
S. Freyer, Ferdinand-Braun-Institute
L. Weixelbaum, Ferdinand-Braun-Institute
P. Kurpas, Ferdinand-Braun-Institut
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