Andre Metzger
-
5a.1 A Method for Yield and Scaling Characterization of FET Structures in an InGaP/GaAs Merged HBT-FET (BiFET) Technology
Andre MetzgerJiang Li, Skyworks Solutions, Inc.Mike Sun, Skyworks Solutions, Inc.Ravi RamanathanCristian Cismaru, Skyworks Solutions, Inc.Jiro Yota