Andre Metzger

  • 5a.1 A Method for Yield and Scaling Characterization of FET Structures in an InGaP/GaAs Merged HBT-FET (BiFET) Technology

    Andre Metzger
    Jiang Li, Skyworks Solutions, Inc.
    Mike Sun, Skyworks Solutions, Inc.
    Ravi Ramanathan
    Cristian Cismaru, Skyworks Solutions, Inc.
    Jiro Yota
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