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Andreas Rummel
Kleindiek Nanotechnik
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12.0.3.2024 3D Visualization and Characterization of SiC MOSFET Junctions Using EBIC and FIB-SEM Tomography
Heiko Stegmann, Carl Zeiss MicroscopyGreg Johnson, Carl Zeiss MicroscopyDavid Taraci, Carl Zeiss MicroscopyAndreas Rummel, Kleindiek Nanotechnik