Andreas Rummel

Kleindiek Nanotechnik
  • 3D Visualization and Characterization of SiC MOSFET Junctions Using EBIC and FIB-SEM Tomography

    Heiko Stegmann, Carl Zeiss Microscopy
    Greg Johnson, Carl Zeiss Microscopy
    David Taraci, Carl Zeiss Microscopy
    Andreas Rummel, Kleindiek Nanotechnik
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