Andrew Findlay
Semilab SDI
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5.6 Non-contact Characterization of Bias Stress-Induced Instability of 2DEG in SiN/AlGaN/GaN Structures
Marshall Wilson, Semilab SDI, Tampa, FL,A. Savtchouk, Semilab SDICarlos Almeida, Semilab SDIAndrew Findlay, Semilab SDIJ. Lagowski, Semilab SDI