Andrew Findlay

Semilab SDI
  • 5.6 Non-contact Characterization of Bias Stress-Induced Instability of 2DEG in SiN/AlGaN/GaN Structures

    Marshall Wilson, Semilab SDI
    Alexandre Savtchouk, Semilab SDI
    Carlos Almeida, Semilab SDI
    Andrew Findlay, Semilab SDI
    Jacek Lagowski, Semilab SDI
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