We report the dispersion characteristics of ScAlN/GaN high-electron-mobility transistors (HEMTs) with various epitaxial designs. Devices were fabricated on both ternary (ScAlN) and quaternary (ScAlGaN) materials. The effects of a GaN capping layer was also investigated. We report similar DC and RF performance for all wafers, but significantly worse dispersion which occurs on the quaternary samples. We observe a total gate and drain lag for the ScAlN wafer to be 49% while the ScAlGaN with and without the GaN cap had 10 and 12% dispersion, respectively.
Andrew Green
Air Force Research Laboratory, Sensors Directorate
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Dispersion Characteristics of ScAlN and ScAlGaN HEMTs by Pulsed I-V Measurements
Kelson Chabak., Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USACathy Lee, Qorvo Inc.Yu Cao, Raytheon IDS Microelectronics, Novati Technologies, Inc. IQEAndy Xie, QorvoEdward Beam, QORVOAntonio Crespo, Air Force Research Laboratory, Sensors DirectorateDennis Walker, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USARobert Fitch, AFRLJames Gillespie, Air Force Research LaboratoryAndrew Green, Air Force Research Laboratory, Sensors DirectorateDownload Paper -
12.2.2023 High Temperature Studies of 140 nm T-gate AlGaN/GaN HEMT Devices
Ahmad Islam, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAAdam Miesle, KBR Inc.Nicholas P. Sepelak, KBR, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAHanwool Lee, KBR Inc.Dennis E. Walker Jr., Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,N. Miller, Air Force Research LaboratoryMatt Grupen, Air Force Research Laboratory, Sensors DirectorateKyle Liddy, Air Force Research Laboratory Sensors Directorate, WPAFB, OH, USAAntonio Crespo, Air Force Research Laboratory, Sensors DirectorateGary Hughes, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OHWenjuan Zhu, University of Illinois, UrbanaKelson Chabak, Air Force Research Laboratory, Sensors DirectorateAndrew J. Green, Air Force Research Laboratory, Sensors Directorate, Wright-Patterson AFB, OH,