B. Wilson

Semilab SDI

  • 15.4.2023 Noncontact Measurement of Doping with Enhanced Throughput and High Precision for Wide Bandgap Wafer Manufacturing

    M. Wilson, Semilab SDI
    Carlos Almeida, Semilab SDI
    I. Shekerov, Semilab SDI
    B. Schrayer, Semilab SDI
    A. Savtchouk, Semilab SDI
    B. Wilson, Semilab SDI
    J. Lagowski, Semilab SDI

    15.4.2023 Marshall Wilson SDI CSMantech 2023 Photoneutralization Manuscript rev3

  • 11.2.4.2024 High Throughput Wafer Characterization for Manufacturing Needs of SiC and Other WBG Technologies

    M. Wilson, Semilab SDI
    Carlos Almeida, Semilab SDI
    I. Shekerov, Semilab SDI
    B. Schrayer, Semilab SDI
    A. Savtchouk, Semilab SDI
    B. Wilson, Semilab SDI
    J. Lagowski, Semilab SDI
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