C. Hentschel

Cardiff University

  • 18.4.2023 Characterisation Techniques for On-Wafer Testing of VCSELs in Volume Manufacture

    Jack Baker, Cardiff University
    C. Hentschel, Cardiff University
    Craig Allford, Cardiff University
    Sara Gillgrass, Cardiff University
    J. Iwan Davies, IQE plc
    Samuel Shutts, Cardiff University
    Peter M. Smowton, Cardiff University

    18.04.2023_Extended Abstract_R1_Compressed