Craig Hall

Qorvo

  • Backside Via Process of GaN Device Fabrication

    Ju-Ai Ruan, Qorvo Inc.
    Craig Hall, Qorvo
    Celicia Della-Morrow, TriQuint Semiconductor
    Tom Nagle, Qorvo, Inc.
    Yinbao Yang, Qorvo, Inc.

  • 17.2 Optical Defect Investigation and Drill Down Automation

    Darrell Lupo, Qorvo, Inc
    Eric McCormick, Qorvo, Inc.
    Michelle Colorado, Qorvo, Inc.
    Mike McClure
    Craig Hall, Qorvo
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  • 17.4 Four Level Category Commonality and a Loophole in Is/Is Not Analysis

    Xiaokang Huang, Qorvo
    Joonbum Kwon, Qorvo
    Elda Clarke, Qorvo
    Gaurav Gupta, Qorvo
    Raymond Wands, Qorvo
    Francis Celii, Qorvo
    Van Tran, Qorvo
    Louis Breaux, Qorvo
    John Gibbon, Qorvo
    Jaime Trujillo, Qorvo
    Karsten Mausolf, Qorvo
    Michael Lube, Qorvo
    Craig Hall, Qorvo
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  • 10.3 Copy, Scale, Develop, and Match – A Methodology for 200mm Bulk Acoustic Wave Filter Pilot Production Line Start up at Qorvo

    Xiaokang Huang, Qorvo
    Charles Dark, Qorvo
    Mike McClure
    Buu Diep, Qorvo
    Craig Hall, Qorvo
    Harold Isom, Qorvo
    Donna Mortensen, Qorvo
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  • 7b.5 Analysis and Solution to Ion Trim Drift Utilizing Software and a Residual Gas Analyzer

    Eric McCormick, Qorvo, Inc.
    Romek Bobkowski, Qorvo, Inc.
    Karsten Mausolf, Qorvo
    Guy Takayesu, Qorvo
    Dario Nappa, TriQuint Semiconductor,TX
    Francis Celii, Qorvo
    Mike McClure
    Craig Hall, Qorvo
    Joseph Raff, Qorvo
    Download Paper