D. Nguyen

Semilab LEI, Lehighton, PA
  • May 19, 2022 // 1:50pm

    17.2 Top Surface Edge Contact for Wafer Level Electrical Characterization of 2DEG in AlGaN/GaN on Semi-insulating Wafers

    Dmitriy Marinskiy, Semilab SDI, Tampa, FL,
    B. Schrayer, Semilab SDI
    Mark Benjamin, Lehighton Electronics Inc,
    J. Lagowski, Semilab SDI
    Marshall Wilson, Semilab SDI, Tampa, FL,
    D. Nguyen, Semilab LEI, Lehighton, PA

    [embeddoc url=”https://csmantech.org/wp-content/uploads/2023/09/17.2.2022-Top-Surface-Edge-Contact-for-Wafer-Level-Electrical-Characterization.pdf” download=”all”]

    Download Paper