Don A. Gajewski

  • Performance and Reliability of AlGaN/GaN HEMT o_blankn 100-mm SiC Substrate with Improved Epitaxial Growth Uniformity

    Sangmin Lee, Wavice Inc.
    Tim Kennedy
    Christer Hallin
    Helder Antunes
    Brian Fetzer
    Scott T. Sheppard
    Al Burk, Wolfspeed, A Cree Company
    Don A. Gajewski
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  • An Optical 0.25-μm GaN HEMT Technology on 100-mm SiC for RF Discrete and Foundry MMIC Products

    Simon M. Wood
    Scott T. Sheppard
    Fabian Radulescu, Radulescu LLP
    Don A. Gajewski
    Bill Pribble
    Donald Farrell
    Ulf Andre Jeffrey B. Barner
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