18.02.2023 CS_MANTECH_2023_Final-Paper-Photoresist Softbake Oven Qualification-v4
Fan Ren
University of Florida
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May 01, 2019 // 4:50pm – 5:10pm
11.3 Extreme Temperature Operation of Ultra-Wide Bandgap AlGaN High Electron Mobility Transistors
Download PaperPatrick Carey IV, University of FloridaFan Ren, University of FloridaAlbert Baca, Sandia National LaboratoriesBrianna Klein, Sandia National LaboratoriesAndrew Allerman, Sandia National LaboratoriesAndrew Armstrong, Sandia National LaboratoriesErica Douglas, Sandia National LaboratoriesRobert Kaplar, Sandia National Labs, Albuquerque, NMPaul Kotula, Sandia National LaboratoriesStephen Pearton, University of Florida -
8b.4 Investigation of Traps in AlGaN/GaN High Electron Mobility Transistors by Sub-Bandgap Optical Pumping
Tsung-Sheng Kang, University of FloridaYi-Hsuan Lin, University of FloridaShihyun Ahn, University of FloridaFan Ren, University of FloridaErin Patrick, University of FloridaMark Law, University of FloridaDavid Cheney, University of FloridaBrent Gila, University of FloridaStephen Pearton, University of Florida -
10b.2 Recovery in dc Performance of Off-State Step-Stressed AlGaN/GaN High Electron Mobility Transistor with Thermal Annealing
Download PaperByungjae Kim, University of FloridaShihyun Ahn, University of FloridaFan Ren, University of FloridaStephen Pearton, University of FloridaDavid Smith, Arizona State UniversityTsung-Sheng Kang, University of FloridaJunhao Zhu -
18.2.2023 Photoresist Softbake Oven Qualification
Nitin Kalra, BAE SystemsJames Mortellaro, BAE Systems Inc.James Martel, BAE Systems Inc.Xiaoping Yang, BAE Systems Inc. -
18.11.2023 Ionization Thresholds and Residue Removal in Inductively Coupled Etching of NiO/Ga2O3 with Ar and BCl3
Chao-Ching Chiang, University of Florida, Gainesville, FLXinyi Xia, University of Florida, Gainesville, FLJian-Sian Li, University of Florida, Gainesville, FLFan Ren, University of FloridaStephen Pearton, University of Florida