Filip Gucmann
Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
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May 01, 2019 // 4:30pm – 4:50pm
11.2 Channel temperature determination for GaN HEMT lifetime testing – Impact of test fixture and device layout.
Filip Gucmann, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TLJames Pomeroy, University of BristolAndrei Sarua, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL