Filip Gucmann

Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
  • May 01, 2019 // 4:30pm – 4:50pm

    11.2 Channel temperature determination for GaN HEMT lifetime testing – Impact of test fixture and device layout.

    Filip Gucmann, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
    James Pomeroy, University of Bristol
    Andrei Sarua, Center for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL
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