Franck Bourgeois

United Monolithic Semiconductors GmbH
  • April 30, 2019 // 4:00pm – 4:20pm

    5.2 A Systematic Data Mining Approach to separate Epitaxial Impacts from Process Impacts for GaAs pHEMT Technologies

    Franck Bourgeois, United Monolithic Semiconductors GmbH
    Peter Gretz, United Monolithic Semiconductors GmbH
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