G.D. Via

Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton

  • GaN Reliability – Where We Are and Where We Need to Go

    G.D. Via, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
    AFRL
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  • Recent Progress in GaN-on-Diamond Device Technology

    J.D. Blevins, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
    G.D. Via, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
    K. Chabak, Air Force Research Laboratory, Sensors Directorate
    A. Bar-Cohen, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
    J. Maurer, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
    A. Kane, Air Force Research Laboratory (AFRL), Defense Advanced Research Projects Agency (DARPA) Booz Allen Hamilton
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  • 8B.1-Microelectronics Commons Hub Overviews Part 2

    David Via, Midwest Microelectronics Consortium
    Jason Conrad, MacroTechnology Works
    Rehan Kapadia, University of Southern California, Los Angeles