G. W. Turner
MACOM Technology Solutions, Lincoln Laboratory
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Effect of Multi-Field Plates on GaN-on-Silicon HEMTs Reverse Breakdown and Leakage Characteristics
T. Boles, MACOM Technology Solutions, Lincoln LaboratoryD. Carlson, MACOM Technology Solutions, Lincoln LaboratoryL. Xia, MACOM Technology Solutions, Lincoln LaboratoryA. Kaleta, MACOM Technology Solutions, Lincoln LaboratoryC. McLean, MACOM Technology Solutions, Lincoln LaboratoryD. Jin, MACOM Technology Solutions, Lincoln LaboratoryT. Palacios, MACOM Technology Solutions, Lincoln LaboratoryG. W. Turner, MACOM Technology Solutions, Lincoln LaboratoryR. J. Molnar, MACOM Technology Solutions, Lincoln Laboratory