Georges Pavlidis
Georgia Institute of Technology
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11.1 Monitoring the Transient Thermal Response of AlGaN/GaN HEMTs using Transient Thermoreflectance Imaging
Download PaperGeorges Pavlidis, Georgia Institute of TechnologySamuel Graham, Georgia Institute of Technology -
11.4 Gate Resistance Thermometry for GaN/Si HEMTs under RF Operation
Download PaperGeorges Pavlidis, Georgia Institute of TechnologyShamit Som, MACOMJason Barrett, MACOMWayne Struble, MACOMJohn Atherton, MACOMSamuel Graham, Georgia Institute of Technology